| | IEEE/ICC Minutes Index |
| | ID | | Presentation Title |
| | Author(s) | Affiliation | Date | Location | Appndx | Keywords |
| | 605 | | Prediction and Measurement of Magnetic Fields in the Vicinity of Transmission Cables |
| | Cooper, J. | 89S | Cambridge, MA | III-A | Magnetic Fields Transmission |
| | 606 | | Synopsis of 3-in-1 SF6 Gas Cable Test Program |
| | Corbett, J. | Detroit Edison | 84F | St. Petersburg, FL | VII-A | Test Gas-Filled SF6 |
| | 607 | | 230KV Pothead Failures on High Pressure Oil Pipe Type Cables |
| | Cornish, H. | Power Auth NY | 73F | Atlanta, GA | VII-A | Pipe Type Failure-termination |
| | 608 | | Installation of Submarine Cables Across Land-Locked Lake |
| | Corry, A. | Boston Edison | 54S | St. Louis, MO | 21 | Submarine |
| | 609 | | Vertically Supported Cables |
| | Corry, A. | Boston Edison | 59F | New York, NY | XI-B | Suspension-support |
| | 610 | | Pulling Tensions on Pipe Cable |
| | Corry, A. | Boston Edison | 56S | Toronto, Canada | 14 | Pulling Pipe Type |
| | 611 | | Buried Cables for Distribution - Final Report |
| | Corry, A. | 60S | Chicago, IL | VII-A | Cable-buried |
| | 612 | | A Five-Year Experiment on Controlled Kenotron Testing at Boston Edison Company |
| | Corry, A. | Boston Edison | 67F | New York, NY | F-1 | DC-testing |
| | 613 | | The Sheath as a Factor in Permissible Pulling Stresses |
| | Corry, A. | Boston Edison | 58F | New York, NY | VI-D | Pulling Sheath |
| | 614 | | The Sheath as a Factor in Permissible Stresses |
| | Corry, A. Geary, E. | Boston Edison | 59F | New York, NY | VI-B | Sheath Pulling |
| | 615 | | Qualification Tests on 230KV Pipe Type Cable PSE&G Co. |
| | Cortelou, W. | Phelps Dodge | 81S | San Diego, CA | VII-A | Pipe Type |
| | 616 | | Migration of Impurities Under AC Field From Semiconductive Shield Material into Cable Insulation |
| | Crine, J. | 89F | St. Petersburg, FL | V-G | Semiconductor Research |
| | 617 | | Migration of Impurities Through the Semiconductive shield - XLPE Interface |
| | Crine, J. | 89S | Cambridge, MA | V-J | Research Semiconductor |
| | Tuesday, January 17, 2006 | http://www.ewh.ieee.org/soc/pes/icc/ | Page 48 of 166 |